发明名称 INSPECTING DEVICE FOR MOUNTED SUBSTRATE
摘要 PURPOSE:To discriminate the kinds of respective components automatically by deciding the kinds of the components based on land data produced by extracting a land and position and shape data on the components which are inputted previously. CONSTITUTION:A control part 46 reads the permissible land presence range 30 of a component 27a successively and supplies it to an image processing part 39, and also supplies image data on an unmounted substrate 25 stored in a memory 37 to the image processing part 39 to cut the image of the permissible land presence range 30 from said image data. Then, a hue lightness conversion command is supplied to the image processing part 39 to perform the hue lightness conversion of respective picture elements constituting the image in the permissible land presence range 30. Then the control part 46 checks whether or not red hue Rc(ij) corresponding to each picture element (ij) in the premissible land presence range 30 is larger than a previously inputted land extraction reference value C to extract a land 28b within the premissible land presence range 30. Thus, the control part 46 recognizes the component 27a as a transistor.
申请公布号 JPS63113682(A) 申请公布日期 1988.05.18
申请号 JP19860256995 申请日期 1986.10.30
申请人 OMRON TATEISI ELECTRONICS CO 发明人 YOTSUYA TERUHISA
分类号 H01L21/66;G01B11/24;G01N21/88;G01N21/93;G01N21/956;G06T1/00;G06T7/00;H05K13/08 主分类号 H01L21/66
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