发明名称 APPARATUS FOR TESTING ELECTRICAL CONDUCTORS IN DISTRIBUTION FRAMES OF TELECOMMUNICATIONS SYSTEMS
摘要 The stacked components of the distribution frame contain double rows of connecting elements (1) for incoming and outgoing electrical conductors (4). The pins (6) of multipoint disconnectors (2) can be inserted between break contact points (5) on the connecting elements (1) inside the stacked components. The disconnectors (2) are designed as printed circuit boards with contact surfaces (7) in the vicinity of the break contact points (5), from which conductor paths (8) lead out to contact zones (9) which are disposed outside the connecting elements (1) so that they are readily accessible for test leads. <IMAGE>
申请公布号 AU7951887(A) 申请公布日期 1988.04.14
申请号 AU19870079518 申请日期 1987.10.09
申请人 SIEMENS A.G., 发明人 NAME NOT GIVEN
分类号 G01R31/02;H04M3/30;H04Q1/14 主分类号 G01R31/02
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