发明名称 PLASMA TREATMENT DEVICE
摘要 PURPOSE:To improve the efficiency of plasma treatment such as sputtering by radiating electromagnetic microwave to at least one electrode, impressing high frequency voltage to electrodes, and forming plasma between a couple of a electrodes. CONSTITUTION:In a sputtering device, a target 13 is mounted to a lower electrode 7 and a wafer 12 is set to an upper electrode 6, and then a treating room 1 is evacuated in high vacuum and supplied with gaseous argon. The microwave emitted by magnetrons 17, 18 is radiated through wave guides 15, 16. By this radiation, a high frequency voltage is impressed between electrodes 6, 7 and a plasma 23 is formed. In this case, the impressed electric power frequency is set at a extremely high value. The self-bias voltage generated between electrodes 6 and 7 is improved thereby, and, by raising the electric charge density, particles to be sputtered are effectively emitted from the target 13 by electrons and efficiently sticked on the wafer 12.
申请公布号 JPS634841(A) 申请公布日期 1988.01.09
申请号 JP19860146882 申请日期 1986.06.25
申请人 HITACHI LTD 发明人 AMADA HARUO
分类号 H01L21/285;B01J19/08;C23C14/34;H01L21/203 主分类号 H01L21/285
代理机构 代理人
主权项
地址
您可能感兴趣的专利