| 摘要 |
PURPOSE:To allow no bonding pad to be damaged and improve checking efficiency by forming electrodes on one side of paired electrodes connected to an electrically shared common electrode and cutting an electrical contact between the common electrode and electrodes to be connected to the former. CONSTITUTION:Each recording head on a support base 12 is individually cut and separated after completion of texts and flow channel formation. When performing this individual cut and separation operation, it is possible to cut an electrical contact between a bonding pad and a common electrode 18 simultaneously. Tests for checking flaws in a protective layer are aimed at forming recording head units 19 into parts requiring a wall 22 of silicon resin under a state in which many recording heads are built in so that an electrolyte 17 may be stored. Tests are conducted by applying voltages between the electrolyte 17 and the common electrode 18 through a testing electrode 21 and a probe 20. Accordingly it is not necessary to connect the probe to each bonding pad without any possibility of being damaged or fouled, thus assuring faultless tests. |
