发明名称 TEST SYSTEM FOR DATA PROCESSOR
摘要 PURPOSE:To provide an action indicating function of a tester to a device to be tested by setting an interface for exchange of information between the tester and the device to be tested. CONSTITUTION:When a device 1 to be tested is carried on a conveyor line to keyboard test processes, a test control program 101 of a processor 10 of the device 1 recognizes the position of the device 1 for execution of test programs 102 and 103. The program 102 delivers an input command given from a KB unit 14 to a KB part 114. While the program 103 produces and indication to a robot 21a. This indication is sent to a tester 2 via a circuit control part 15' and discriminated by a data transmission/reception segmentation part 251 to be informed to control parts 252-254 respectively. Then keying operations are carried out for test evaluation of a KB unit 14. The result of this test evaluation is stored in a floppy disk 16.
申请公布号 JPS61279945(A) 申请公布日期 1986.12.10
申请号 JP19850121993 申请日期 1985.06.05
申请人 FUJITSU LTD 发明人 SATO SHUJI;IMAI KAZUYUKI
分类号 G06F11/22;G06F3/02 主分类号 G06F11/22
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