发明名称 DEFECT INSPECTION FOR CYCLIC PATTERN
摘要 PURPOSE:To enable discrimination of a defect in monochromatic manner, by performing a detection processing based on data as obtained by subtracting image data after the displacement of a cyclic pattern from that before the displacement thereof to inspect the cyclic pattern efficiently at a high accuracy. CONSTITUTION:A pattern 6 to be inspected is lighted by a transmission lighting section made up of a DC power source 9, an incandescent lamp 8 and a diffusion plate 7 and the inspection area is photographed with a TV camera 1. An image processor 2 converts the output signal of the TV camera 1 into digital from analog to be a digital image data and various processings including addition and subtraction on the screen are performed with a frame memory and an arithmetic unit. A control section 3 controls the image processor 2 and a pattern shifting mechanism composed of an X-Y stage 10 and a driving section 5. Then, when subtraction is done between image data before and after the shifting of the pattern, changes in the video signal due to a unit pattern with no defect are cancelled by changes in the video signal due to shading or the like in a photography system to reduce to virtually zero so that the value varies locally at only the defective point. Thus, the defect can be detected based on this fact.
申请公布号 JPS61256237(A) 申请公布日期 1986.11.13
申请号 JP19850096593 申请日期 1985.05.09
申请人 DAINIPPON PRINTING CO LTD 发明人 WATANABE KAZUO
分类号 G01M11/02;G01B11/24;G01B11/30;G01M11/00;G01N21/88;G01N21/956;G03F1/84;H01L21/027;H01L21/30;H01L21/66;H04N7/18 主分类号 G01M11/02
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