| 摘要 |
PURPOSE:To decrease a memory capacity of a memory means storing information for the control of the operation of each circuit as well as to enable a test of the circuits which operate faster than the memory means reads out by freeing the memory means from storing information for the test. CONSTITUTION:A test of operating speed is made, not by feeding an instruction code from a memory means of a long access time such as a ROM but by feed ing an instruction code from a high speed pattern generator through external input terminals 17-1-17-10, decoding it by a decoder 16 to control each circuit and comparing the result with an expected value. In this way, a test can be made on the circuits which operate faster than an instruction ROM reads out. |
