发明名称 |
ION IMPLANTATION MASK DEVICE AND METHOD OF IMPLANTATION USING THIS DEVICE |
摘要 |
PURPOSE:To enable ion implantation to be performed without causing contamination by using an ion implantation mask plate at least the ion-beam-side of which has a surface made of either the same material as the semi-conductive wafer or its oxide or nitride. CONSTITUTION:At least the ion-beam-source-side of an ion implantation mask plate 12 has a surface 14 which is made of either the same material as a semi- conductive wafer 1 or its oxide or nitride. As a result, either the same material as the wafer 1 of the same material as the wafer 1 and oxygen (or nitrogen) is sputtered outside the mask plate 12. When the same material as the wafer 1 is sputtered and enters the wafer 1, it is not contaminated. When the same material as the wafer 1 and oxygen or nitrogen is sputtered, the wafer 1 is not contaminated by the same material as the wafer 1 and oxygen or nitrogen gas is liberated from the surface of the wafer 1. |
申请公布号 |
JPS6113542(A) |
申请公布日期 |
1986.01.21 |
申请号 |
JP19840133854 |
申请日期 |
1984.06.28 |
申请人 |
NIPPON DENSHIN DENWA KOSHA |
发明人 |
NAKAJIMA SADAO;IZUMI KATSUTOSHI |
分类号 |
H01J37/317;H01L21/265;H01L21/266;(IPC1-7):H01J37/317 |
主分类号 |
H01J37/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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