发明名称 FORMATION OF RESIST PATTERN
摘要 PURPOSE:To stabilize the sensitivity of a resist by uniformly cooling a resist film on a processing plate only for radiation heat transmission by using a heat acceptor disposed horizontally on the top in a chamber. CONSTITUTION:A resist is coated on a blank mask 13, disposed horizontally in a chamber 1, and baked under the prescribed conditions. Then, a heat acceptor 7 disposed horizontally on the top in the chamber 1 is used to uniformly cool a resist film on a the mask 13 only by the radiation heat transmission by using the acceptor 7 disposed horizontally at the top in the chamber. Then, electromagnetic wave of the prescribed wavelength range or particle beam of the prescribed energy is selectively emitted, and a developing is then performed to form a resist pattern.
申请公布号 JPS60133727(A) 申请公布日期 1985.07.16
申请号 JP19830241376 申请日期 1983.12.21
申请人 TOSHIBA KK 发明人 SHIGEMITSU FUMIAKI;TSUCHIYA NOBUJI
分类号 G03F7/20;G03F7/16;G03F7/38;H01L21/027 主分类号 G03F7/20
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