| 摘要 |
PURPOSE:To contrive to reduce the number of components and the cost by a method wherein a semiconductor chip is provided therein with the function of voltage or current control. CONSTITUTION:A control logical gate circuit 21 necessary to test a logical circuit part 22 is connected to a chip terminal (e.g. A terminal) necessary to kill a voltage control functional part, and the logical level (V+ or V-) supplied to the chip terminal A is varied; thereby killing the functional part. Then, the number of test terminals is reduced by the construction of common use to the LSI logical test mode, and thus by the common use of the terminal A. Since such a construction that the function of voltage or current control is incorporated in the semiconductor chip is thus made, the reduction of the number of components and of the cost can be contrived; besides, the action of the logical circuit part can be simply tested without providing a test terminal in particular. |
