发明名称 |
Method of manufacturing a MOSFET using accelerated ions to form an amorphous region |
摘要 |
A method for manufacturing MOSFET type semiconductor devices comprises forming a gate insulation layer and a gate electrode on a single crystal semiconductor substrate; introducing impurities in the substrate using the gate electrode as a mask; introducing accelerated ions deeper into the substrate than the impurities and overlapping at least a portion of the region in which the impurities are introduced in order to convert that portion to an amorphous state; diffusing the impurities into the amorphous region using a heating atmosphere, in order to form source and drain regions and, at the same time, converting the amorphous region to a single crystal; and forming source and drain electrodes in contact with the source and drain regions.
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申请公布号 |
US4498224(A) |
申请公布日期 |
1985.02.12 |
申请号 |
US19820544991 |
申请日期 |
1982.10.24 |
申请人 |
TOKYO SHIBAURA DENKI KABUSHIKI KAISHA |
发明人 |
MAEGUCHI, KENJI |
分类号 |
H01L21/225;H01L21/265;H01L21/336;H01L27/12;H01L29/08;H01L29/78;H01L29/786;(IPC1-7):H01L21/425 |
主分类号 |
H01L21/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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