发明名称 Method of manufacturing a MOSFET using accelerated ions to form an amorphous region
摘要 A method for manufacturing MOSFET type semiconductor devices comprises forming a gate insulation layer and a gate electrode on a single crystal semiconductor substrate; introducing impurities in the substrate using the gate electrode as a mask; introducing accelerated ions deeper into the substrate than the impurities and overlapping at least a portion of the region in which the impurities are introduced in order to convert that portion to an amorphous state; diffusing the impurities into the amorphous region using a heating atmosphere, in order to form source and drain regions and, at the same time, converting the amorphous region to a single crystal; and forming source and drain electrodes in contact with the source and drain regions.
申请公布号 US4498224(A) 申请公布日期 1985.02.12
申请号 US19820544991 申请日期 1982.10.24
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 MAEGUCHI, KENJI
分类号 H01L21/225;H01L21/265;H01L21/336;H01L27/12;H01L29/08;H01L29/78;H01L29/786;(IPC1-7):H01L21/425 主分类号 H01L21/225
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