发明名称 |
An ion beam machining device. |
摘要 |
<p>An ion beam machining device has a plasma-generating chamber (21), a machining chamber (23), and an ion-extracting grid (22) disposed between the two chambers (21, 23). The grid (22) has an insulator layer (24) facing the plasma-generating chamber (21) and a conductor layer (25) facing the machining chamber (23). A plurality of holes (26) extend through the insulator and conductor layers (24, 25). The conductor layer (25) is held at an electric potential negative with respect to the plasma. </p> |
申请公布号 |
EP0132015(A2) |
申请公布日期 |
1985.01.23 |
申请号 |
EP19840301276 |
申请日期 |
1984.02.27 |
申请人 |
UNIVERSITY OF TOKYO |
发明人 |
MASUZAWA, TAKAHISA;TSUCHIYA, ICHIRO |
分类号 |
C23F4/00;C23C14/32;C23F1/00;H01J27/02;H01J37/08;H01J37/30;H01J37/305;H01J37/317;H01L21/302;(IPC1-7):H01J37/32 |
主分类号 |
C23F4/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|