发明名称 An ion beam machining device.
摘要 <p>An ion beam machining device has a plasma-generating chamber (21), a machining chamber (23), and an ion-extracting grid (22) disposed between the two chambers (21, 23). The grid (22) has an insulator layer (24) facing the plasma-generating chamber (21) and a conductor layer (25) facing the machining chamber (23). A plurality of holes (26) extend through the insulator and conductor layers (24, 25). The conductor layer (25) is held at an electric potential negative with respect to the plasma. </p>
申请公布号 EP0132015(A2) 申请公布日期 1985.01.23
申请号 EP19840301276 申请日期 1984.02.27
申请人 UNIVERSITY OF TOKYO 发明人 MASUZAWA, TAKAHISA;TSUCHIYA, ICHIRO
分类号 C23F4/00;C23C14/32;C23F1/00;H01J27/02;H01J37/08;H01J37/30;H01J37/305;H01J37/317;H01L21/302;(IPC1-7):H01J37/32 主分类号 C23F4/00
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