发明名称 MANUFACTURE OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To form ultrafine electrodes by an electrode material layer remaining without damage on the surface of a semiconductor substrate by insulating the electrode material layer part by an ion implantation. CONSTITUTION:A resist pattern 5(11) as an ion implanting pattern is formed on a polycrystalline silicon layer 4(10), an ion implantation is executed to remove and heat treat the pattern 5(11), the layer 4(10) part thus ion implanted is formed in an SiO2 film 6(12), and a capacitor electrode 7(transfer gate electrode 13) is formed of the remaining polycrystalline silicon layer not ion implanted. Since the surface of the substrate not exposed as by an RIE method to eliminate a damage, the characteristics of the element can be preferable.
申请公布号 JPS59169172(A) 申请公布日期 1984.09.25
申请号 JP19830043621 申请日期 1983.03.16
申请人 TOSHIBA KK 发明人 MATSUMOTO YASUO
分类号 H01L27/10;H01L21/8242;H01L27/108;H01L29/78 主分类号 H01L27/10
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