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发明名称
IC SOCKET FOR HIGH TEMPERATURE TEST
摘要
申请公布号
JPS58189975(A)
申请公布日期
1983.11.05
申请号
JP19820074284
申请日期
1982.04.28
申请人
MITSUBISHI DENKI KK
发明人
NAKABAYASHI MASAKAZU
分类号
H01R33/76
主分类号
H01R33/76
代理机构
代理人
主权项
地址
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