发明名称 CHARACTERISTIC MEASURING DEVICE OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To execute a measurement exactly at a high speed, by holding a value of a drain-source electric power source at necessary constant voltage, and controlling it by a switch as necessary. CONSTITUTION:A constant forward current [IF] is made to flow between the gate and the source by a constant-current power source 4 in a state that a switch 23 is opened, and at that time, gate-source voltage [VGS1] is set to the first sample holding circuit 12 in accordance with an enable signal (control signal at the time of input) from a controlling circuit, and is applied to an inverted input terminal of the first differential amplifier 17 through a resistance 14. In this case, a microcomputer, etc. are effective as the controlling circuit 21. Subsequently, the switch 23 is switched to the closed state, and the drain-source voltage is applied to the drain through a drain current detecting resistance 22 from a drain-source electric power source 3.
申请公布号 JPS58179365(A) 申请公布日期 1983.10.20
申请号 JP19820061890 申请日期 1982.04.14
申请人 NIPPON DENKI KK 发明人 FUJIKI ISAO
分类号 G01R31/26;(IPC1-7):01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址