发明名称 AUTOMATIC INSPECTING DEVICE FOR SURFACE FLAW
摘要 PURPOSE:To provide an inspecting device for surface flaw which enables to perform a high-speed and reliable measurement of a surface flaw of a high-temperature object to be measured, such as hot slabs, which is consecutively delivered for a long period of time using an electronic scanning type image sensor. CONSTITUTION:An object M to be measured is consecutively delivered in a direction of an arrow mark, and laser light emitted from a laser source 11 is rectilinearly (in a beltlike manner) 14 projected onto the object M to be measured by a cylindrical lens 13. Laser light 12 reflected from the object M to be measured enters a CCD camera 15, and an electronic scanning is conducted at the inside of the CCD camera 15 to produce an electric output. A sector 16 turns at a higher speed compared with the running speed of the object M to be tested. Thus, the laser light 12 enters the CCD camera 15 only for a very short time at each revolution of the sector 16, and is shut off from an incident light for other time. As a result, heat rays emitted from the object M to be measured are shut off likely, and thereby the CCD camera 15 is prevented from being damaged by heat.
申请公布号 JPS5892937(A) 申请公布日期 1983.06.02
申请号 JP19810190775 申请日期 1981.11.30
申请人 UESHIMA YOSHIO 发明人 UESHIMA YOSHIO
分类号 G01N21/89;G01N21/892;(IPC1-7):01N21/89 主分类号 G01N21/89
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