摘要 |
<p>A unit for irradiating a workpiece (5) includes an electron accelerator (1) with its axis parallel to the plane of the magnetic circuit frame of a deflecting electromagnet (6) located in front of a vacuum scanning chamber outlet window (4). A scanning electromagnet has a bias winding (10) supplied with d.c. to direct the beam to the deflecting electromagnet aperture. A sweep generator has a correction circuits to reduce current change speed in the scanning winding as the beam moves to the most remote edge of the deflecting electromagnet from the accelerator and to increase the speed as the beam moves in the opposite direction. The device can be used e.g. in irradiation of polymer films, hardening lacquer coatings or modifying textiles to create patterns and permits the overall size and wt. of a radiation unit to be reduced with associated reduction in the amount of local biological protection required.</p> |