发明名称 Method for producing a film resistor
摘要 A method for producing a film resistor as a measurement resistor for resistance thermometers, in which a thin resistor film (2) of platinum is deposited on a main surface of an electrically insulating supporting body (1), in the form of a small plate, by cathode sputtering, the electrical resistance of which resistor layer is a measure of the temperature, the resistor layer (2) for achieving the required temperature co-efficient being subjected to an annealing and subsequently being structured by means of a laser beam into the form of a meandering track. In this case, a meandering partial resistor (R1) is cut into the resistor layer (2), the resistance of which partial resistor is less than the desired resistance of the measurement resistor. After temperature treatment of this partial resistor (R1), series resistors are cut into the resistor film (2), the partial resistor (R1) being used for determining the temperature of the resistance film (2) and the meandering structure of the resistor film (2) being interrupted when the resistance (RN) measured simultaneously between the connecting surfaces (21) of the measurement resistor corresponds to the desired resistance (RN,O) determined by a computer at normal temperature. <IMAGE>
申请公布号 DE3120252(A1) 申请公布日期 1982.12.09
申请号 DE19813120252 申请日期 1981.05.21
申请人 DRALORIC ELECTRONIC GMBH, 8672 SELB, DE 发明人 BREM, WALTER, DR.-ING., 8671 MARKTLEUTHEN, DE;HOEFFGEN, DIETRICH, DIPL.-PHYS. DR., 8672 SELB, DE
分类号 G01K7/18;H01C17/12;H01C17/242;(IPC1-7):H01C17/12 主分类号 G01K7/18
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