| 摘要 |
<p>An integrated circuit chip with an on-chip test system has flip-flops arranged in ranks (50, 60,..., 90) and chains and interconnected by combinatorial logic (56, 80, ..., 100), each flip-flop having a test input fed directly from the preceding flip-flop (52, 58, 70, ...) bypassing the combinatorial logic and operative in the absence of a NOP (normal operation) signal. Multiplexers (40) couple the end of each chain to the beginning of the next. Each flip-flop acts as an ordinary flip-flop preceded by a multiplexer. An additional initialising input may be multiplexed into the flip-flops (Figure 2). The test input couplings may be non-linear, to prevent reconvergence of signals (Figures 2-5). To test the combinatorial logic feeding a particular flip-flop, a test bit pattern may be sequentially clocked into the flip-flops feeding that piece of combinatorial logic with NOP = 0, NOP set to 1 for one clock period, and the resulting bit sequentially clocked out with NOP = 0 again.</p> |
