发明名称 MULTIPOINT SPECTRAL MEASURING DEVICE
摘要 PURPOSE:To facilitate measurements of multiple points in a space, by using an entry slit in common. CONSTITUTION:A common slit 1, respectively concaved surface diffraction gradings 2a-2c, and respective exit slits 3a-3c are combined to constitute substantially three units of ordinary Seya-Namioka type spectroscopes: (1, 2a, 3a), (1, 2b, 3b), (1c, 2c, 3c). As directions of fluxes entering the concaved surface diffraction gratings are different from one another, a spectral measurements are conducted on different points with respect all the gratings. As an entry slit is used in common as mentioned in the above, it is possible to make an entire device small and facilitate measurements of many points.
申请公布号 JPS56137225(A) 申请公布日期 1981.10.27
申请号 JP19800040287 申请日期 1980.03.31
申请人 发明人
分类号 G01J3/12;G01J3/02 主分类号 G01J3/12
代理机构 代理人
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