| 发明名称 |
Multiple ratio single particle counter |
| 摘要 |
The present invention is an improved multiple ratio single particle counter. Intensities of scattered radiation are measured at more than two angles and ratios of these intensities are derived. These ratios are compared with calibration curves to determine an unambiguous measure of the particle parameter.
|
| 申请公布号 |
US4188121(A) |
申请公布日期 |
1980.02.12 |
| 申请号 |
US19770764657 |
申请日期 |
1977.02.01 |
| 申请人 |
HIRLEMAN, EDWIN D JR;WITTIG, SIGMAR L K |
发明人 |
HIRLEMAN, EDWIN D JR;WITTIG, SIGMAR L K |
| 分类号 |
G01N15/02;G01N15/10;G01N15/14;(IPC1-7):G01N15/02 |
主分类号 |
G01N15/02 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
