HIGH TEMPERATURE TEST EQUIPMENT FOR ELECTRONIC PARTS,申请号JP19770155167-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	HIGH TEMPERATURE TEST EQUIPMENT FOR ELECTRONIC PARTS
摘要
申请公布号	JPS5487190(A)	申请公布日期	1979.07.11
申请号	JP19770155167	申请日期	1977.12.23
申请人	TOKYO SHIBAURA ELECTRIC CO	发明人	OKAMOTO ARATA
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Animal chew comprising moulded, dehydrated fruit chips

use of milk anti-inflammatory factor to inhibit an inflammatory response and/or neutrophil migration

Quinoline and quinazoline compounds useful in therapy, particularly in the treatment of benign prostatic hyperplasia

Forming patterned metal strip using patterned forming rollers

Microfluidic electrokinetic movement voltages responsive to currents at electrodes

Manufacturing glued timber blocks using press with pressure plates and lateral stops

RADIO TELEPHONE WITH HIGH ANTENNA EFFICIENCY

HEAT SEAL APPARATUS FOR LENS PACKAGES

Dihydrobenzofuran and related compounds useful as anti-inflammatory agents

CARTON SUPPORTING METHOD AND SUPPORTING BODY THEREOF

NON-WOVEN FABRIC LAMINATES

NONAQUEOUS ELECTROLYTE SECONDARY BATTERY

ELECTROCHEMICAL GASEOUS DIFFUSION HALF CELL

METHOD AND APPARATUS FOR PRODUCING THERMOPLASTIC RESIN SHEET

sustained release pharmaceutical composition containing both slow release and fast release mini-granules coated with dexfenfluramine

Method for producing N-phosphonomethylglycine using aminomethylphosphonic acid, potassium cyanide or sodium cyanide and formaldehyde

Rail mounted amphibious vehicle with infra-red remote control

Pharmaceutical composition containing cardenolides particularly uscharidin (uscharin) for treating excessive cell proliferation