发明名称 Method of and apparatus for locating B type and point type defects in a glass ribbon
摘要 A beam of light is transmitted through a glass ribbon along a scan path onto a beam splitter. The beam splitter directs a first scanning beam onto a first detector responsive to B type defects and a second scanning beam onto a second detector responsive to point type defects. Monitoring the movement of the scanning beam and the signals from the detectors, the location of B type and point type defects in a glass ribbon are obtained.
申请公布号 US4097151(A) 申请公布日期 1978.06.27
申请号 US19760667325 申请日期 1976.03.16
申请人 PPG INDUSTRIES, INC. 发明人 SHAW, JR., HUGH E.
分类号 G01N21/896;(IPC1-7):G01N21/00;G01N21/16 主分类号 G01N21/896
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