发明名称 DEFECT TESTER
摘要 PURPOSE:To improve accuracy of defect test for product of paper or the like, by increasing intensity of radiation and preventing uneven radiation; those are accomplished by arranging reflectors in front of face of projector in such a way as faces of reflectors stand roughly parallel to the optical axis.
申请公布号 JPS52119380(A) 申请公布日期 1977.10.06
申请号 JP19760036549 申请日期 1976.03.31
申请人 OMRON TATEISI ELECTRONICS CO 发明人 KOYANAGI KATSUUMI
分类号 G01N21/84;G01N21/89;G01N21/892 主分类号 G01N21/84
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