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发明名称
Verfahren zur Bestimmung der elektrischen Leitfaehigkeit und der Dicke einer halbleitenden Schicht
摘要
申请公布号
DE1523118(A1)
申请公布日期
1969.10.16
申请号
DE19651523118
申请日期
1965.02.08
申请人
VEB HALBLEITERWERK FRANKFURT/ODER
发明人
HERBERT STRELLER,DIPL.-ING.
分类号
G01B7/06;G01N27/04
主分类号
G01B7/06
代理机构
代理人
主权项
地址
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