发明名称 PROBE ASSEMBLY FOR PROBE CARD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a probe assembly for a probe card, which is easy to assemble, reduced in production cost, sharply enhanced for productivity, and its maintenance/repair cost can be reduced by separating easily its probes and support body from a printed board. <P>SOLUTION: This probe assembly for a probe card consists of the support body joined to the printed board, the plurality of probes joined to the support body, and a first insulation resin body for fixing the probes to the support body. The support body includes a first side surface, a first under surface linked to the side surface, and a plurality of first insert slots formed in the side surface and in the under surface. The probes include first arm parts inserted into the insert slots formed in the side surface of the support body, second arm parts inserted into the insert slots formed in the under surface of the support body, a first terminal part connected to the printed board, and a second terminal part connected to a tested body. Such a probe assembly for a probe card can be simply and easily assembled since it includes a structure in which the probes are inserted into the insert slots in the support body. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008309787(A) 申请公布日期 2008.12.25
申请号 JP20080146299 申请日期 2008.06.03
申请人 NICTECH CO LTD 发明人 JEON BYUNG-HEE;KANG DAE-CHEOL
分类号 G01R1/073;H01L21/66 主分类号 G01R1/073
代理机构 代理人
主权项
地址