发明名称 SLIT INSPECTING CIRCUIT
摘要 PURPOSE:To prevent the occurrence of count error, by a method wherein a rotary angle between a specified number of pulses of slits detected by light is measured based on an output of a shaft encoder, and it is decided whether or not a normal number of them exists. CONSTITUTION:Only a specified number n of slits 2 is formed in a disc 1, which is driven for rotation by a motor 5. A shaft encoder 6, which generates N pulses, being enoughly move than the slit number n, at each one complete turn, is mounted to the rotary shaft of the motor 5, and the signal thereof is inputted to a counter 11. Meanwhile, a photo transistor 4 detects light, emitted from a luminous diode 3, through the slits 2, and supplies it to a counter 7. The counter 7 is subtraction-counted each time the slit detecting signal from the transistor 4 is inputted. A rotary angle between n pieces of the slits in the disc so inspected is measured, and the value is processed by a processor. This permits the measurement of the number of the slits in the disc without the occurrence of a count error.
申请公布号 JPS5835444(A) 申请公布日期 1983.03.02
申请号 JP19810134042 申请日期 1981.08.28
申请人 JIDOSHA KOGAI ANZEN KIKI GIJUTSU KENKYU KUMIAI;HITACHI OOTOMOTEIBU ENGINEERING KK 发明人 HASEGAWA NORIO
分类号 G01N21/84;G01D5/36 主分类号 G01N21/84
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