| 摘要 |
The method and device disclosed are for the testing of microelectronic components in a centrifuge. The method includes the steps of loading the components to be tested into a holder or stick and then providing a device controlling the dispensing of the microelectronic components from the holder into receptacles circularly arranged in an insert which fits into the rotor of the centrifuge. The control device in the form disclosed is in the form of a manual tool having a passageway into which the end of the holder can be extended. The tool is positioned between the holder and a receptacle in the insert so as to be able to control the dispensing of components into the receptacle or unloading them from the receptacle. The tool embodies a trigger and a plunger member actuatable thereby which can obstruct the passageway through the tool or to open the passageway for the passage of components through it.
|
