发明名称 METHOD OF VOLTAGE TIME BEHAVIOR MEASURING ON PROBE OF METALLIC COATINGS' THICKNESS COULOMETRIC METER
摘要 The method is intended for measuring time course of voltage on a probe, during electrolytic etching of the surface by the coulometric meter for metal coating thickness. The size of the voltage on the probe is taken in samples synchronically with the position of the membrane, possibly the pump piston, which generates pressure onto the surface of the electrolyte in working chamber of the probe. The sizes of the successive samples, taken in the same phase of the position of the membrane or the pump piston, are compared and the time course of the voltage is determined.
申请公布号 CS273763(B1) 申请公布日期 1991.04.11
申请号 CS19880007526 申请日期 1988.11.17
申请人 VEVERKA JAN ING.,CS 发明人 VEVERKA JAN ING.,CS
分类号 G01N27/42;(IPC1-7):G01N27/42 主分类号 G01N27/42
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