发明名称 Device for measuring a heat flux
摘要 The invention relates to a device for measuring a heat flux, comprising a thermopile formed of a plurality of thermojunctions of distributed type. The device is formed of a first and a second ceramic substrate (Ce1, Ce2), a first face of the first substrate (Ce1) is composed of cavities which are separated by ceramic spacers (Ca1, Ca2, Ca3, Ca4), the thermopile is placed on a second planar face of the first substrate which is located opposite the first face, the spacers of the first substrate are arranged beneath one thermojunction (Tj2, Tj4, Tj6, Tj8) in two of the thermopile, a face of the second substrate (Ce2) is composed of cavities which are separated by ceramic spacers (Ca5, Ca6, Ca7, Ca8, Ca9), the spacers of the second substrate rest on a thermojunction (Tj1, Tj3, Tj5, Tj7, Tj9) beneath which a spacer of the first substrate is not arranged.
申请公布号 US9360382(B2) 申请公布日期 2016.06.07
申请号 US201113808676 申请日期 2011.07.06
申请人 UNIVERSITE DU MAINE 发明人 Camberlein Lionel;Gaviot Etienne;Polet Frédéric;Beche Bruno;Failleau Guillaume;Morice Ronan;Le Sant Véronique
分类号 G01K17/00;G01J5/02;G01J5/04;G01J5/12;G01K1/16;H01L35/34 主分类号 G01K17/00
代理机构 Nixon & Vanderhye P.C. 代理人 Nixon & Vanderhye P.C.
主权项 1. A device for measuring a heat flux, comprising a thermopile formed of a plurality of thermojunctions of distributed type, wherein the device is formed of a first and a second ceramic substrate, a first face of the first substrate is composed of cavities which are separated by ceramic spacers, the thermopile is placed on a second planar face of the first substrate which is located opposite the first face, the spacers of the first substrate are arranged beneath one thermojunction in two of the thermopile, a face of the second substrate is composed of cavities which are separated by ceramic spacers, the spacers of the second substrate rest on a thermojunction beneath which a spacer of the first substrate is not arranged.
地址 Le Mans FR