Circuit for compacting and storing circuit test responses

摘要

The compactor has test data inputs connected with a switching outputs of an electronic switch, a several of test data outputs and test balance inputs. H-matrix-XOR-gates (1-7) are arranged between test data inputs and test data outputs. A compensation-XOR-gate is arranged in between the test data inputs and test data outputs. An input of the compensation-XOR-gate is provided for input of the compensation value. Independent claims are also included for the following: (1) a circuit arrangement with an electronic switch (2) a test arrangement with a circuit arrangement (3) a method of operating an electronic switch (4) a computer program running on a test device for implementing the method for testing an integrated circuit (5) a data medium with a computer program (6) a method for downloading the computer program from the internet on the computer attached to the data network (7) a method for designing a circuit.