发明名称 |
Systems and methods for fast bit error rate estimation |
摘要 |
Changes in the distribution of memory cells across memory states allow calculation of Bit Error Rate (BER). Comparison of test data stored in memory and a known good copy of the test data provides test data BER from which user data BER may be obtained. Data may be handled differently according to its BER. |
申请公布号 |
US9483339(B2) |
申请公布日期 |
2016.11.01 |
申请号 |
US201414318310 |
申请日期 |
2014.06.27 |
申请人 |
SanDisk Technologies LLC |
发明人 |
Navon Ariel;Sharon Eran |
分类号 |
H04L1/00;G06F11/07;G06F11/10;G06F12/02;G11C16/34;G11C11/56 |
主分类号 |
H04L1/00 |
代理机构 |
Davis Wright Tremaine LLP |
代理人 |
Davis Wright Tremaine LLP |
主权项 |
1. A method of determining an error rate for data stored in a nonvolatile memory array comprising:
programming a population of memory cells to a plurality of states; recording an indicator of the number of the memory cells programmed to a first state of the plurality of states; subsequently performing a read operation to determine the number of the memory cells that are read as being in the first state; determining a difference between the number of the memory cells programmed to the first state and the number of the memory cells that are read as being in the first state; and calculating the error rate for data in the population of memory cells from the difference. |
地址 |
Plano TX US |