发明名称 METHOD OF MANUFACTURING GALLIUM NITRIDE COMPOUND SEMICONDUCTOR
摘要 PROBLEM TO BE SOLVED: To manufacture a gallium nitride compound semiconductor excellent in crystalinity. SOLUTION: An SiN buffer body is discretely formed on a board 10, over which a GaN buffer layer is formed at a low temperature, and a GaN semiconductor layer 16 thereon at a high temperature. By discretely forming the SiN buffer body, crystal growth of a low-temperature buffer layer depending on board is prevented, promoting single crystallization of a seed crystal at growing of the GaN buffer layer 16. Further, an SiO2 30 is discretely formed on the board 10 to allow the GaN semiconductor layers 16 associate together on the SiO2 30, resulting is relaxed distortion.
申请公布号 JP2001326384(A) 申请公布日期 2001.11.22
申请号 JP20000143826 申请日期 2000.05.16
申请人 SAKAI SHIRO;NITRIDE SEMICONDUCTOR CO LTD 发明人 SAKAI SHIRO
分类号 H01L21/20;H01L21/205;H01L33/06;H01L33/12;H01L33/32 主分类号 H01L21/20
代理机构 代理人
主权项
地址