| 摘要 |
Approaches provide for determining an internal rate of resistance of a battery in a computing device. In particular, various examples enable using a processor to expose the battery to a first load at a first rate of consumption and to measure a first analog voltage across the battery during exposure of the battery to the first load. The processor is able to expose the battery to a second load a second rate of consumption and to measure a second analog voltage across the battery during exposure of the battery to the second load. Linear equations can be used to solve for the battery's internal rate of resistance based at least in part on the first rate of consumption, the first analog voltage, the second rate of consumption, and the second analog voltage. In various embodiments, the battery's internal rate of resistance can be correlated to a battery health indicator. |
