X-RAY DIFFRACTION MICROSCOPE,申请号JP19900286147-传众专利搜索

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发明名称	X-RAY DIFFRACTION MICROSCOPE
摘要
申请公布号	JPH04160400(A)	申请公布日期	1992.06.03
申请号	JP19900286147	申请日期	1990.10.24
申请人	NEC CORP	发明人	KIMURA SHIGERU
分类号	G01N23/00;G21K7/00;H01J37/295	主分类号	G01N23/00
代理机构		代理人
主权项
地址

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