| 摘要 |
PROBLEM TO BE SOLVED: To provide an orbital analysis device capable of accurately detecting movement from fine movement to large movement, and further to provide an orbital analysis method.SOLUTION: An orbital analysis device 1000 includes: a posture detection section 20 being fixed to an object body and being provided with an inertial sensor 10 provided with an angular velocity sensor 50 and at least two acceleration sensors 61 and 62; a posture detection device 100 provided with a data I/F section 30 amplifying detection data and performing A/D conversion, an operation section 40 processing data, a sensor control section 80 selecting at least one of the acceleration sensors 61 and 62 on the basis of operation results, and a posture data generation section 70 generating posture data from output data from the inertial sensor 10 including the acceleration sensor selected and transmitting the posture data generated; an analysis device 200 provided with an analysis section 220 analyzing the posture data from a posture detection device, a storage section storing the posture data and analysis results and a notification section 240 notifying of the analysis results; and communication means 90 and 210 between the posture detection device and an analysis device. |
