发明名称 |
Precursors Of Manganese And Manganese-Based Compounds For Copper Diffusion Barrier Layers And Methods Of Use |
摘要 |
Semiconductor devices and methods of making semiconductor devices with a barrier layer comprising manganese nitride are described. Also described are semiconductor devices and methods of making same with a barrier layer comprising Mn(N) and, optionally, an adhesion layer. |
申请公布号 |
US2016181150(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201514919149 |
申请日期 |
2015.10.21 |
申请人 |
Applied Materials, Inc. |
发明人 |
Liu Feng Q.;Sheu Ben-Li;Knapp David;Thompson David |
分类号 |
H01L21/768;H01L21/02 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a semiconductor device, the method comprising:
providing a substrate comprising a dielectric layer disposed thereon, the dielectric layer having a feature with at least one sidewall; and forming a manganese nitride barrier layer on the dielectric layer, the barrier layer formed using one or more of Mn(t-Bu2N)2 or Mn(TMP)2; and depositing a fill layer over the barrier layer. |
地址 |
Santa Clara CA US |