发明名称 Precursors Of Manganese And Manganese-Based Compounds For Copper Diffusion Barrier Layers And Methods Of Use
摘要 Semiconductor devices and methods of making semiconductor devices with a barrier layer comprising manganese nitride are described. Also described are semiconductor devices and methods of making same with a barrier layer comprising Mn(N) and, optionally, an adhesion layer.
申请公布号 US2016181150(A1) 申请公布日期 2016.06.23
申请号 US201514919149 申请日期 2015.10.21
申请人 Applied Materials, Inc. 发明人 Liu Feng Q.;Sheu Ben-Li;Knapp David;Thompson David
分类号 H01L21/768;H01L21/02 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of forming a semiconductor device, the method comprising: providing a substrate comprising a dielectric layer disposed thereon, the dielectric layer having a feature with at least one sidewall; and forming a manganese nitride barrier layer on the dielectric layer, the barrier layer formed using one or more of Mn(t-Bu2N)2 or Mn(TMP)2; and depositing a fill layer over the barrier layer.
地址 Santa Clara CA US