发明名称 ANALYSIS METHOD FOR SUPPORTING CLASSIFICATION
摘要 The invention relates to an analysis method for supporting classification, a determination method for determining analysis parameters Ys, Ei, Ii, σi for the analysis method, a computer program product, and an optical analysis system for supporting classification, with which system analysis parameters Ys, Ei, Ii, σi can be defined on the basis of first and second calibration data. The parameters provide classification support according to the discriminant analysis and on the basis of measured values Pi of optical characteristics i, in particular of organic dispersions, and the information content thereof for classification, in particular the diagnosis of disease; and permit a classification proposal or a diagnosis proposal in comparison with a threshold Ys.
申请公布号 US2016202171(A1) 申请公布日期 2016.07.14
申请号 US201414912876 申请日期 2014.08.05
申请人 SIEMENS HEALTHCARE DIAGNOSTICS PRODUCTS GMBH 发明人 Kavsek Barbara;Lederer Peter;Taal Peter;van den Boogaart Jan
分类号 G01N15/14;G01N33/49;G01N21/49 主分类号 G01N15/14
代理机构 代理人
主权项 1. An analysis method for classification assistance having the following steps: ascertaining measured values (Pi) for optical features (i) of a test dispersion to be classified, wherein the test dispersion is formed from a dispersion medium, in particular blood plasma, and a dispersed phase and the dispersed phase has cells or cell components of organic materials, calculating a classification index (Y), defined byY=∑i=1nli*(Pi-Ei)/σi wherein the classification index (Y) is dependent on a number (n) of the optical features (i) of the test dispersion, a significance parameter (li) of the respective optical feature (i), a mean value (Ei) of the respective optical feature (i), and a standard deviation (σi) of the respective optical feature (i).
地址 Marburg DE