| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and apparatus for inspecting a semiconductor laser having a simple construction, which can perform quick inspection and can highly accurately discriminate the magnitude of chirp at the rising of optical output, as well as to provide a semiconductor laser inspected by such an inspection method and an inspecting apparatus. SOLUTION: The method drives a semiconductor laser using two types of driving signals, in which the number of rising times per unit time is different from a first driving signal, to measure the optical output strength of a side mode corresponding to each driving signal. Further, the strengths of two side modes are compared, and based on the results, inspection results are output. The inspection results may be obtained based on a side mode oppression ratio corresponding to each driving signal. COPYRIGHT: (C)2009,JPO&INPIT
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