发明名称 Sequential station tool for wet processing of semiconductor wafers
摘要 Methods and apparatus are provided for processing semiconductor wafers sequentially. Sequential processes employ multi-station processing modules, where particular encompassing wafer processes are divided into sub-processes, each optimized for increasing wafer to wafer uniformity, result quality, and overall wafer throughput. In one example, a copper electroplating module includes separate stations for wetting, initiation, seed layer repair, fill, overburden, reclaim, and rinse.
申请公布号 US8883640(B1) 申请公布日期 2014.11.11
申请号 US201313892900 申请日期 2013.05.13
申请人 Novellus Systems, Inc. 发明人 Patton Evan E.;Cacouris Theodore;Broadbent Eliot;Mayer Steven T.
分类号 H01L21/445;C25D17/28;H01L21/768;C25D17/00 主分类号 H01L21/445
代理机构 Weaver Austin Villeneuve & Sampson LLP 代理人 Weaver Austin Villeneuve & Sampson LLP
主权项 1. An apparatus for processing a semiconductor wafer having a recessed feature, the apparatus comprising: a cluster tool containing a plurality of separate stations; wherein the plurality of separate stations is configured to perform a plurality of distinct processes; and a mechanism for transporting the semiconductor wafer to and from each station of the plurality of separate stations, wherein the plurality of separate stations comprises: (a) an initiation station configured at least for reducing copper oxide on a copper layer residing on the semiconductor wafer using a reducing gas or a wet reduction chemistry; and(b) an electrofill station configured at least for receiving the wafer after initiation and for filling the recessed feature on the semiconductor wafer with a metal; andwherein the plurality of separate stations are in a stacked format.
地址 Fremont CA US