Machine to detect Phonon Gain to Control Desired Reactions in an Electrically Driven Hydrogen Loaded Material

摘要

A machine to detect phonon gain to control desired reactions using a container with at least two optical ports, a power supply and wiring connections to enable driving a material sample to be examined, a power supply to drive at least two lasers, a controller to regulate the output of the lasers, a beam path to enable illumination of the sample, a controller to regulate the electric power delivered to the sample enabling driving in more than one state, a detector system to examine the backscatter radiation from the sample by frequency, a second beam path to enable the backscatter to reach the detector system, a computation system to separate and determine the ratios of the examined backscattered frequencies to determine the intensities and distribution, and a second computation system to compare the examined intensities and distribution and ratios to the desired intensities and distribution and ratios to determine what states were detected and to derive changes for the power supply driving the sample.

主权项

1. A machine to detect phonon gain in an electrically driven hydrogen loaded material to control desired reactions comprising:
a container with at least two optical ports and at least two electrical ports; a material which can provide at least one desired reaction when electrically driven; a power supply and wiring connections to enable said electrical driving of said material; a power supply to drive at least two optical sources; an optical controller to regulate the output of said optical sources; a beam path to enable illumination of the sample; a electrical power controller to regulate control of electric power delivered to said material enabling driving in more than one state; an optical detector system to examine the backscatter radiation from the material which is illuminated; a second beam path to enable said backscatter to reach said detector system; an means to separate the frequencies of said backscatter; a computation system to determine the intensities and distribution of said backscatter; a second computation system to compare the desired intensities and distribution of said backscatter and to compare that to what was is preferred so as to derive the changes necessary for said electric power controller to change said power supply driving said material.