| 摘要 |
<P>PROBLEM TO BE SOLVED: To perform the debugging operation of an IC tester program by constructing a virtual IC tester having a simple structure and high versatility. <P>SOLUTION: The debugging device for the IC tester program comprises a test information extraction means 2 for extracting test information including the operation setting and test standard information of the IC tester from the IC tester program for controlling the operation of the IC tester connected to a performance board on which an IC to be tested is mounted and capable of testing the IC to be tested, a net list generation means 7 for generating a net list to be used for a simulator for simulating the operation of the IC tester from the operation setting information of the IC tester and the circuit information of the IC to be tested and the performance board, and a determination means 11 for comparing the execution result of the virtual circuit based on the net list with a test standard based on the test standard information and determining whether the execution result satisfies the test standard or not. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
