HOLDER FOR AGING TEST OF SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To efficiently and inexpensively carry out a precise aging test, even when the number of semiconductor devices to be tested is increased, and even when a plurality of the semiconductor devices different in their specification are stored in one thermostatic oven. SOLUTION: This aging test holder for the semiconductor device 13 provided with plural semiconductor device sockets 15 for mounting the plurality of the semiconductor devices 13 for the aging test on a base 11 for aging the devices, and a heat radiation body 21 for radiating heat generated from the semiconductor devices 13 by supplying a testing current to the semiconductor devices 13 is provided with a heater wire 28 of a temperature regulating heat exchange member for regulating a temperature of the semiconductor devices 13 to be brought into a set test temperature in the thermostatic oven, in the base 11 for aging the devices 13.