发明名称 INSPECTING DEVICE FOR CIRCUIT BOARD OR THE LIKE
摘要 PURPOSE:To enable to make narrower the attaching pitches of the probes to the supporting plate, and also, to easily perform the wiring process by a method wherein the earth pins is grounded disposed penetratingly in the supporting plate separately from the probes. CONSTITUTION:Numerous coaxial type movable contact probes P and earth pins 23 have been made to pierce through a supporting plate 22 in the vertical direction and the coaxial type movable contact probes P and the earth pins 23 have been supported by the supporting plate 22. Both of the coaxial type movable contact probes P and the earth pins 23 have been mutually connected electrically in pairs in the positions of the uppper and lower surfaces of the supporting plate 22 through connection fittings 46. The connection fittings 46 have been respectively constituted of a ring part 46a, which is attached to the probe P, a ring part 46b, which is attached to the earth pin 23, and a connection part 46c, and this inspecting device has been made so that the external conductor 29 of each of the probes P functions as the earth side by the connection fittings 46. As the earth side has been made into a structure, wherein the earthed side is connected to the earthing pin 23 by the connection fittings 46 from the external conductor 29 in such a manner, each probe P can be formed into one of a small diameter. As a result, the attaching pitches of the probes P to the supporting plate 22 can be made narrower.
申请公布号 JPS60207343(A) 申请公布日期 1985.10.18
申请号 JP19840064237 申请日期 1984.03.31
申请人 YOKOO SEISAKUSHO:KK 发明人 NAKAJIMA KOU;SAIDA KATSUTOSHI
分类号 G01R31/00;G01R31/26;H01L21/66;(IPC1-7):H01L21/66 主分类号 G01R31/00
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