METHOD OF MEASURING THICKNESS OF SURFACE OF PROCESSED LAYERS OF FERROMAGNETIC ELECTROCONDUCTIVE ARTICLES,申请号SU19853972166-传众专利搜索

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发明名称	METHOD OF MEASURING THICKNESS OF SURFACE OF PROCESSED LAYERS OF FERROMAGNETIC ELECTROCONDUCTIVE ARTICLES
摘要
申请公布号	SU1310619(A1)	申请公布日期	1987.05.15
申请号	SU19853972166	申请日期	1985.11.04
申请人	INST PRIKLADNOJ FIZ AN BSSR	发明人	ZATSEPIN NIKOLAJ N,SU;KORENNOJ BORIS P,SU;GORBASH VLADIMIR G,SU;BABARIN ALEKSANDR YA,SU;DELENDIK MIKHAIL N,SU;KASHCHENKO IGOR I,SU
分类号	G01B7/06	主分类号	G01B7/06
代理机构		代理人
主权项
地址

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