发明名称 IC SOCKET
摘要 PROBLEM TO BE SOLVED: To rub a terminal surface with a contact pin and to reduce an inductance component by deforming an elastic member with the slope component force applied to a first slant side when the contact pin is pressed on a terminal and a wire by an action section, and supporting the elastic member movably on the terminal and wire with the contact pin support member of a pressing member. SOLUTION: A contact pin 11 has a first slant side 11a and a second slant side 11b crossing each other, the first slant side 11a is pressed by the action section 17 of a pressing lever 3, and the second slant side 11b is pressed by an elastic member 18. When the contact pin 11 is further pressed while the contact sections 11d, 11e of the contact pin 11 are abutted with the terminal and wire of an IC, the contact pin 11 deforms an elastic member 18 and is moved while rubbing the terminal and wire. The contact sections 11d, 11e peel off the natural oxide film covering the terminal surface and wire of the IC. The contact pin 11 is miniaturized to reduce an inductance component, and a high-frequency characteristic is measured with high precision.
申请公布号 JP2000195636(A) 申请公布日期 2000.07.14
申请号 JP19980376832 申请日期 1998.12.25
申请人 ENPLAS CORP 发明人 YAMAMOTO TAKESHI
分类号 H01R33/76;G01R1/04;G01R31/26;(IPC1-7):H01R33/76 主分类号 H01R33/76
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