发明名称 粒子検出装置
摘要 PROBLEM TO BE SOLVED: To provide a particle detector capable of repeatedly accurately detecting particles by suppressing damage of a substrate surface.SOLUTION: A particle detector 100A comprises: a collection chamber 5A including a collection mechanism for collecting particles in the air by adsorbing them on a surface of a collection jig 12 being a substrate surface; and a detection chamber 5B including a detection mechanism for detecting particles derived from organisms out of the particles adsorbed on the surface of the collection jig 12. The collection mechanism includes a needle-like discharge electrode 17 placed above the collection jig 12, and the discharge electrode 17 is placed in a direction forming an angle between a direction of a needle-like tip and a normal line of the collection jig 12. A particle charged by discharge from the discharge electrode 17 is adsorbed to the collection jig 12 by a potential difference between the particle and the discharge electrode 17, and the particles derived from the organisms existing in a region 15 irradiated by a light emitting element are detected on the basis of a fluorescence amount from the irradiated region 15.
申请公布号 JP5997532(B2) 申请公布日期 2016.09.28
申请号 JP20120168167 申请日期 2012.07.30
申请人 シャープ株式会社 发明人 奥野 大樹;伴 和夫;藤岡 一志;藤田 英明;鈴木 暁大
分类号 G01N15/00;G01N1/02 主分类号 G01N15/00
代理机构 代理人
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