| 发明名称 |
TEST SYSTEMS AND METHODS OF TESTING DEVICES |
| 摘要 |
A test system for performing a plurality of tests on a plurality of devices includes a tester having a plurality of tester pins and at least one socket, wherein the plurality of devices are received in the at least one socket. The test system further includes a plurality of multiplexers, wherein each of the multiplexers has an input coupled to one of the plurality of tester pins and each of the multiplexers has outputs coupled to individual device pins of the devices. The tester is configurable to perform a first test on a first plurality of devices and a second test on a second plurality of devices without disconnecting the devices from the at least one socket. |
| 申请公布号 |
US2017108533(A1) |
申请公布日期 |
2017.04.20 |
| 申请号 |
US201514882704 |
申请日期 |
2015.10.14 |
| 申请人 |
Texas Instruments Incorporated |
发明人 |
Ohmart Dale Vincent |
| 分类号 |
G01R1/04;G01R31/28 |
主分类号 |
G01R1/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test system for performing a plurality of tests on a plurality of devices, the test system comprising:
a tester having a plurality of tester pins; at least one socket, wherein the plurality of devices are receivable in the at least one socket; and a plurality of multiplexers, each of the multiplexers having an input coupled to one of the plurality of tester pins, each of the multiplexers having outputs coupled to device pins of individual devices; wherein the tester is configurable to perform a first test on a first plurality of devices and a second test on a second plurality of devices without disconnecting the devices from the at least one socket. |
| 地址 |
Dallas TX US |
