MEASUREMENT DEVICE

摘要

Provided is a measurement device that is highly accurate due to an optical configuration. The following are provided: a pattern projector that projects an optical pattern; and a pattern image receiver that receives the optical pattern which was projected. The pattern image receiver includes: a pattern image pickup unit that picks up an image of the optical pattern and converts the same to image pickup data; and a point coordinate value calculation unit that, on the basis of the converted image pickup data, calculates a 3D coordinate value for the position of the image pickup unit or a position known from the image pickup unit.

主权项

1. A measurement device comprising:
a pattern projector projecting an optical pattern; and a pattern image receiver receiving the projected optical pattern, the pattern image receiver including:
a pattern image pickup unit picking up an image of the projected optical pattern and converting the pattern into image pickup data; anda point coordinate value calculation unit calculating three-dimensional coordinate values of a position of the pattern image pickup unit or a position known from the pattern image pickup unit on the basis of the converted image pickup data.