发明名称 Three-dimensional semiconductor memory device
摘要 A three-dimensional (3D) semiconductor memory device and a method for fabricating the same, the device including insulating layers stacked on a substrate; horizontal structures between the insulating layers, the horizontal structures including gate electrodes, respectively; vertical structures penetrating the insulating layers and the horizontal structures, the vertical structures including semiconductor pillars, respectively; and epitaxial patterns, each of the epitaxial patterns being between the substrate and each of the vertical structures, wherein a minimum width of the epitaxial pattern is less than a width of a corresponding one of the vertical structures.
申请公布号 US9559111(B2) 申请公布日期 2017.01.31
申请号 US201514790969 申请日期 2015.07.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Yoo Dongchul;Nam Phil Ouk;Yang Junkyu;Lee Woong;Lee Woosung;Kim JinGyun;Eom Daehong
分类号 H01L29/792;H01L27/115;H01L29/423 主分类号 H01L29/792
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A three-dimensional (3D) semiconductor memory device, comprising: a lower structure including a lower gate pattern and a lower semiconductor pattern penetrating the lower gate pattern, the lower semiconductor pattern being connected to a substrate; and an upper structure including upper gate patterns stacked on the lower structure, an upper semiconductor pattern penetrating the upper gate patterns, and a vertical insulator between the upper semiconductor pattern and the upper gate patterns, the upper semiconductor pattern being connected to the lower semiconductor pattern, wherein the lower semiconductor pattern has a rounded sidewall adjacent to the lower gate pattern, and wherein the lower semiconductor pattern includes an epitaxial pattern.
地址 Suwon-Si, Gyeonggi-Do KR